AFM Perspective

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AFM Perspective | Thomas Barkley

Materials Science and Engineering – Staff
Atomic Force Microscopy (Square)
A collection of semiconductor, metallic, biological, and polymer materials imaged by the atomic force microscope and visualized in perspective view. Clockwise from top left: etched silicon (1.5 microns), surface of a nitrile glove (80 microns), filamentous bacteria on a glass slide (7 microns), and the surface of a nickel TEM grid (20 microns).

Posted on

April 10, 2019